2016.03.31
Ultra-Low-Noise CMOS Image Sensors and Their Application
Dr. Min-Woong Seo (Research Institute of Electronics, Shizuoka University)
2016. 03. 31 (Thu) 14:00 ~ 14:40
Seminar Room 1, Myodaiji (132-134)
Division of Evolutionary Biology, Yosuke Tamada (7545)
The low light-level imaging techniques have applications in many diverse scientific and industrial fields those require both high sensitivity and sufficient dynamic range. In this talk, a low temporal read noise and high conversion gain reset-gate(RG)-less CMOS image sensor (CIS) and a CMOS lock-in pixel image sensor for time-resolved imaging will be presented. First, for achieving the low noise performance, the proposed pixel has two unique structures: 1) between the transfer gate and FD node and 2) between the reset gate and FD node. As a result, a CIS with the proposed pixels is able to achieve a high pixel conversion gain and low read noise. By using the RG-less CIS, for the first time, high contrast images with less than 0.3e-rms noise level have been successfully generated at an extremely low light level. Next, the time-resolved CIS has been developed for biomedical imaging, e.g., FLIM and NIRS. It achieves a very high time resolution, a very short intrinsic response time, and low random noise with true correlated double sampling (CDS) operation.